Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-04-18
2006-04-18
Nelms, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S275000, C257S276000, C257S278000, C257S315000
Reexamination Certificate
active
07030448
ABSTRACT:
The structure of the nonvolatile memory includes a substrate having source/drain formed at unselected sides and source/drain with extension source/drain formed at other selected sides. A gate dielectric layer is formed on the substrate and a gate is formed on the gate dielectric layer. An isolation layer is formed along the surface of the gate. Spacers are formed attached on the sidewalls of the gate.
REFERENCES:
patent: 5486480 (1996-01-01), Chen
patent: 6468915 (2002-10-01), Liu
patent: 2002/0163039 (2002-11-01), Clevenger et al.
Applied Intellectual Properties Co., Ltd.
Nelms David
Perkins Coie LLP
Tran Long
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