Formation of finFET using a sidewall epitaxial layer

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S933000, C257SE21562

Reexamination Certificate

active

07078299

ABSTRACT:
A method of forming a finFET transistor using a sidewall epitaxial layer includes forming a silicon germanium (SiGe) layer above an oxide layer above a substrate, forming a cap layer above the SiGe layer, removing portions of the SiGe layer and the cap layer to form a feature, forming sidewalls along lateral walls of the feature, and removing the feature.

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patent: 6777288 (2004-08-01), Padmanabhan et al.
patent: 6815738 (2004-11-01), Rim
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patent: 6943087 (2005-09-01), Xiang et al.
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patent: 2004/0253792 (2004-12-01), Cohen et al.
patent: 2005/0205932 (2005-09-01), Cohen

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