Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-28
2005-06-28
Dildine, R. Stephen (Department: 2133)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06912701
ABSTRACT:
An approach for power supply noise modeling for test pattern development. For one aspect, conditions that may result in power supply noise-related failures are identified and the resulting faults are ranked.
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Dildine R. Stephen
Faatz Cynthia T.
Intel Corporation
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