Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-11-15
2005-11-15
Tsai, H. Jey (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S381000, C438S268000, C438S270000
Reexamination Certificate
active
06964895
ABSTRACT:
A vertical one-transistor, floating-body DRAM cell is fabricated by forming an isolation region in a semiconductor substrate, thereby defining a semiconductor island in the substrate. A buried source region is formed in the substrate, wherein the top/bottom interfaces of the buried source region are located above/below the bottom of the isolation region, respectively. A recessed region is etched into the isolation region, thereby exposing sidewalls of the semiconductor island, which extend below the top interface of the buried source region. A gate dielectric is formed over the exposed sidewalls, and a gate electrode is formed in the recessed region, over the gate dielectric. A drain region is formed at the upper surface of the semiconductor island region, thereby forming a floating body region between the drain region and the buried source region. Dielectric spacers are formed adjacent to the gate electrode, thereby covering exposed edges of the gate dielectric.
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Bever Hoffman & Harms LLP
Hoffman E. Eric
Monolithic System Technology, Inc.
Tsai H. Jey
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