Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-03-15
2005-03-15
Pham, Hoai (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S254000, C438S396000
Reexamination Certificate
active
06867094
ABSTRACT:
The disclosure describes a stacked capacitor and a method of forming the same. The method prevents a storage node of the stacked capacitor from crumbling due to lack of support, thereby improving the reliability of semiconductor devices that incorporate stacked capacitors. The disclosure also describes a stacked capacitor with a greater capacitance than a stacked capacitor in accordance with the conventional art.
REFERENCES:
patent: 5710075 (1998-01-01), Tseng
patent: 6423608 (2002-07-01), Kim
patent: 6696713 (2004-02-01), Ishibashi
patent: 20010052614 (2001-12-01), Ishibashi
Marger & Johnson & McCollom, P.C.
Pham Hoai
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