Semiconductor integrated circuit having a self-testing function

Details Semiconductor integrated circuit having a self-testing function Semiconductor integrated circuit having a self-testing function

2005-03-22

2005-03-22

Deady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C375S221000, C714S733000

Reexamination Certificate

active

06871311

ABSTRACT:
A semiconductor integrated circuit device includes a transmitting circuit capable of converting first parallel signals to a first serial signal, a receiving circuit capable of converting a second serial signal to second parallel signals, a test signal generating circuit, and an operation judging circuit, all of which are formed on a single semiconductor chip. The test signal generating circuit and the operation judging circuit are formed so as to operate in accordance with a clock having a frequency corresponding to a transfer rate of the first or second parallel signals.

REFERENCES:
patent: 4225958 (1980-09-01), Funatsu
patent: 4545686 (1985-10-01), Ushikoshi
patent: 4833395 (1989-05-01), Sasaki et al.
patent: 5343461 (1994-08-01), Barton et al.
patent: 5353434 (1994-10-01), Katayama
patent: 5787114 (1998-07-01), Ramamurthy et al.
patent: 2-19051 (1990-01-01), None

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit having a self-testing function does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit having a self-testing function, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit having a self-testing function will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3418576