Method for fabricating a vertical NROM cell

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S259000

Reexamination Certificate

active

06916715

ABSTRACT:
A method for fabricating a vertical nitride read-only memory (NROM) cell. A substrate having at least one trench is provided. A spacer is formed over the sidewall of the trench. Subsequently, ion implantation is performed on the substrate using the spacer as a mask to form doping areas as bit lines in the substrate near its surface and the bottom of the trench. Bit line oxides are formed over each of the doping areas. After the spacer is removed, a conformable insulating layer as gate dielectric is deposited on the sidewall of the trench and the surface of the bit line oxide. Finally, a conductive layer as a word line is deposited over the insulating layer and fills in the trench.

REFERENCES:
patent: 5460988 (1995-10-01), Hong
patent: 5460989 (1995-10-01), Wake
patent: 5595927 (1997-01-01), Chen et al.
patent: 5703387 (1997-12-01), Hong
patent: 5998261 (1999-12-01), Hofmann et al.
patent: 6008079 (1999-12-01), Wu
patent: 6022779 (2000-02-01), Shin et al.
patent: 6486028 (2002-11-01), Chang et al.
patent: 6555870 (2003-04-01), Kirisawa
patent: 6670246 (2003-12-01), Hsiao et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for fabricating a vertical NROM cell does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for fabricating a vertical NROM cell, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating a vertical NROM cell will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3393216

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.