Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-01-25
2005-01-25
Lee, Eddie (Department: 2811)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S244000, C438S250000
Reexamination Certificate
active
06846711
ABSTRACT:
A semiconductor device includes an interlevel insulating film, a contact plug, a barrier film, a first electrode, a capacitor insulating file, and a second electrode. The interlevel insulating film is formed on a semiconductor substrate. The contact plug extends through the interlevel insulating film and is formed from a conductive material. The barrier film is formed from a tungsten-based material on the upper surface of the contact plug. The first electrode is connected to the contact plug via the barrier film and formed from a metal material on the interlevel insulating film. The capacitor insulating film is formed from an insulating metal oxide on the first electrode. The second electrode is insulated by the capacitor insulating film and formed on the surface of the first electrode.
REFERENCES:
patent: 5414301 (1995-05-01), Thomas
patent: 6190965 (2001-02-01), Clampitt
patent: 6239461 (2001-05-01), Lee
patent: 6245580 (2001-06-01), Solayappan et al.
patent: 6319765 (2001-11-01), Cho et al.
patent: 6326258 (2001-12-01), Iizuka
patent: 6326315 (2001-12-01), Uchiyama et al.
patent: 6342425 (2002-01-01), Joo
patent: 6348402 (2002-02-01), Kawanoue et al.
patent: 6403414 (2002-06-01), Marsh
K. Ono et al. “(Ba, Sr) Ti03Capacitor Technology for Gbit-Scale DRAMs” IEDM Tech. Dig., (4 pages), (1998).
Jun Lin et al. “Achievement of tungsten films by annéaling tungsten nitride covered with SiO2top layer” Proc. of Advanced Metallization Conference, (2 pages), (1997).
Kawano Yumiko
Yamasaki Hideaki
Finnegan Henderson Farabow Garrett & Dunner LLP
Lee Eddie
Owens Douglas W.
Tokyo Electron Limited
LandOfFree
Method of making a metal oxide capacitor, including a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making a metal oxide capacitor, including a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a metal oxide capacitor, including a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3390246