Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-05-31
2005-05-31
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S227000, C438S297000, C438S306000, C438S519000, C438S524000, C257SE21417
Reexamination Certificate
active
06900101
ABSTRACT:
LDMOS transistor devices and fabrication methods are provided, in which additional dopants are provided to region of a substrate near a thick dielectric between the channel and the drain to reduce device resistance without significantly impacting breakdown voltage. The extra dopants are added by implantation prior to formation of the thick dielectric, such as before oxidizing silicon in a LOCOS process or following trench formation and before filling the trench in an STI process.
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Brady III W. James
Fourson George
Garner Jacqueline J.
Pham Thanh V.
Telecky , Jr. Frederick J.
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