Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package
Reexamination Certificate
2011-03-15
2011-03-15
Toledo, Fernando L (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
C257S690000, C257S693000, C257S723000
Reexamination Certificate
active
07906839
ABSTRACT:
A semiconductor device has an inductor and capacitor formed on the substrate. The inductor and capacitor are electrically connected in series. The inductor is a coiled conductive layer. The capacitor has first and second conductive layers separated by an insulating layer. A first test pad and second test pad are formed on the substrate. A terminal of the inductor is coupled to the first and second test pads. A third test pad and fourth test pad are formed on the substrate. A terminal of the capacitor is coupled to the third and fourth test pads such that the inductor and capacitor are connected in shunt between the first and second test pads and the third and fourth test pads. An electrical characteristic of the inductor and capacitor such that resonant frequency and quality factor are tested using a two-port shunt measurement which negates series resistance of test probes.
REFERENCES:
patent: 6424028 (2002-07-01), Dickinson
patent: 6825818 (2004-11-01), Toncich
patent: 7305223 (2007-12-01), Liu et al.
Frye Robert C.
Lin Yaojian
Liu Kai
Atkins Robert D.
Patent Law Group
STATS ChipPAC Ltd.
Toledo Fernando L
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