Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-04-19
2011-04-19
Lebentritt, Michael S (Department: 2829)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S268000, C438S269000, C438S271000, C438S272000, C438S273000
Reexamination Certificate
active
07927952
ABSTRACT:
A method of manufacturing semiconductor devices comprises forming an semiconductor layer of the first conduction type on a substrate of the first conduction type; forming an anti-oxidizing layer on the surface of the semiconductor layer of the first conduction type, the anti-oxidizing layer having an aperture only through a region for use in formation of a guard ring layer of the second conduction type; forming the guard ring layer of the second conduction type in the surface of the semiconductor layer of the first conduction type through implantation of ions into a surface where said anti-oxidizing layer is formed; forming an oxide layer at least in the aperture; forming a base layer of the second conduction type adjacent to the guard ring layer of the second conduction type in the surface of the semiconductor layer of the first conduction type; and forming a diffused layer of the first conduction type through implantation of ions into the base layer of the second conduction type.
REFERENCES:
patent: 4868135 (1989-09-01), Ogura et al.
patent: 5963799 (1999-10-01), Wu
patent: 6127247 (2000-10-01), Wu
patent: 6198131 (2001-03-01), Tung
patent: 6258670 (2001-07-01), Tung
patent: 6465308 (2002-10-01), Cheng et al.
patent: 6563169 (2003-05-01), Miyakoshi et al.
patent: 2002/0127793 (2002-09-01), Murata et al.
patent: 2003/0034531 (2003-02-01), Kanda et al.
patent: 2005/0202637 (2005-09-01), Chiola
patent: 2007/0128788 (2007-06-01), Lee et al.
patent: 8-274313 (1996-10-01), None
Akiyama Miwako
Kawaguchi Yusuke
Yamaguchi Yoshihiro
Kabushiki Kaisha Toshiba
Kusumakar Karen M
Lebentritt Michael S
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
LandOfFree
Method of manufacturing semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of manufacturing semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing semiconductor devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2740839