Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-03-08
2011-03-08
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
07904771
ABSTRACT:
A self-diagnostic circuit includes a setting unit receiving a plurality of detection signals generated in an integrated circuit device, and determining a type of detection signal to be detected among the received plurality of detection signals. A counter is coupled to the setting unit and counts a number of a signal corresponding to the type of the detection signal to be detected.
REFERENCES:
patent: 5987629 (1999-11-01), Sastry et al.
patent: 6012148 (2000-01-01), Laberge et al.
patent: 7617424 (2009-11-01), Frodsham et al.
patent: 2004/0078690 (2004-04-01), Kohashi
patent: 2004/0199834 (2004-10-01), Fukae
patent: 2005/0257104 (2005-11-01), Wood
patent: 4-245309 (1992-09-01), None
Kerveros James C
McGinn IP Law Group PLLC
Renesas Electronics Corporation
LandOfFree
Self-diagnostic circuit and self-diagnostic method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Self-diagnostic circuit and self-diagnostic method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-diagnostic circuit and self-diagnostic method for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2727554