Semiconductor device and method of fabricating the...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07994013

ABSTRACT:
A semiconductor device comprises a gate electrode on a semiconductor substrate, drift regions at opposite sides of the gate electrode, source and drain regions in the respective drift regions, and shallow trench isolation (STI) regions in the respective drift regions between the gate electrode and the source or drain region, wherein the drift regions comprise first and second conductivity-type impurities.

REFERENCES:
patent: 5844275 (1998-12-01), Kitamura et al.
patent: 6903421 (2005-06-01), Huang et al.
patent: 2002/0132406 (2002-09-01), Disney
patent: 2002/0137318 (2002-09-01), Peake et al.
patent: 2008/0290411 (2008-11-01), Lee
patent: 1926690 (2007-03-01), None
Huang Chih-Feng Yang; “Isolated High-Voltage LDMOS Transistor Having a Split Well Structure”; esp@cenet; Chinese Publication No. CN1926690 (A); Publication Date: Mar. 7, 2007; esp@cenet Database—Worldwide.
Partial Chinese Office Action date stamped Jul. 24, 2009; Chinese Patent Application No. 2008101248935; The State Intellectual Property Office of P.R.C., People's Republic of China.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of fabricating the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of fabricating the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of fabricating the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2697729

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.