Method for separately optimizing spacer width for two or...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S197000, C438S270000, C438S275000, C438S303000, C438S735000, C438S911000, C257SE21626, C257SE21640

Reexamination Certificate

active

07902021

ABSTRACT:
A method for making a semiconductor device is disclosed. In accordance with the method, a semiconductor structure is provided which includes (a) a substrate (203), (b) first and second gate electrodes (219) disposed over the substrate, each of the first and second gate electrodes having first and second sidewalls, and (c) first (223) and second (225) sets of spacer structures disposed adjacent to the first and second gate electrodes, respectively. A first layer of photoresist (231) is then disposed over the structure such that the first set of spacer structures is exposed and the second set of spacer structures is covered, after which the first set of spacer structures is partially etched.

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patent: 6187620 (2001-02-01), Fulford, Jr. et al.
patent: 6194279 (2001-02-01), Chen et al.
patent: 6461951 (2002-10-01), Besser et al.
patent: 6509264 (2003-01-01), Li et al.
patent: 6696334 (2004-02-01), Hellig et al.
patent: 6746927 (2004-06-01), Kammler et al.
patent: 2004/0087090 (2004-05-01), Grudowski et al.
patent: 2004/0175890 (2004-09-01), Lee et al.

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