Method for speeding up serial data tolerance testing

Details Method for speeding up serial data tolerance testing Method for speeding up serial data tolerance testing

2011-08-23

2011-08-23

Trimmings, John (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Error count or rate

C714S738000, C714S025000, C714S048000, C714S705000, C714S709000, C714S715000, C714S723000, C714S724000, C714S734000, C714S739000, C375S224000, C375S225000, C375S226000, C702S069000

Reexamination Certificate

active

08006141

ABSTRACT:
A receive test accelerator retrieves an adjusted jitter amount and an adjusted test time in which to test a device. The adjusted jitter amount and the adjusted test time correspond to an adjusted bit error rate that is extrapolated from a baseline bit error rate, which corresponds to a baseline jitter amount. In turn, the receive test accelerator tests the device, at the adjusted test time, using a data stream that is modulated by the adjusted jitter amount.

REFERENCES:
patent: 6076175 (2000-06-01), Drost et al.
patent: 6934648 (2005-08-01), Hanai et al.
patent: 6986091 (2006-01-01), Moore et al.
patent: 7239969 (2007-07-01), Tabatabaei et al.
patent: 7305025 (2007-12-01), Yamaguchi et al.

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