Test apparatus, pattern generator, test method and pattern...

Details Test apparatus, pattern generator, test method and pattern... Test apparatus, pattern generator, test method and pattern...

2011-04-26

2011-04-26

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S731000, C714S715000, C714S735000, C714S742000

Reexamination Certificate

active

07934136

ABSTRACT:
Provided is a test apparatus for testing a specimen by using a test pattern and an expected value pattern. The test apparatus includes: a control unit for outputting a test pattern to the specimen; a pattern converting unit for converting the expected value pattern based on an output pattern output from the specimen upon an input of the test pattern; and a determination unit for determining the specimen as a non-defective product or a defective product by using the converted expected value pattern.

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patent: 2004-150820 (2004-05-01), None

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