Method and apparatus for de-embedding on-wafer devices

Details Method and apparatus for de-embedding on-wafer devices Method and apparatus for de-embedding on-wafer devices

2011-05-31

2011-05-31

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Testing or evaluating

Reexamination Certificate

active

07954080

ABSTRACT:
A method and system for de-embedding an on-wafer device is disclosed. The method comprises representing the intrinsic characteristics of a test structure using a set of ABCD matrix components; determining the intrinsic characteristics arising from the test structure; and using the determined intrinsic characteristics of the test structure to produce a set of parameters representative of the intrinsic characteristics of a device-under-test (“DUT”).

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