Method and system for carrying out a process on an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C702S081000, C702S118000, C702S119000, C702S123000, C700S110000

Reexamination Certificate

active

07870447

ABSTRACT:
System and method for carrying out a process on an integrated circuit. The method includes reading a data key including subkeys, determining a process parameter set using a parameter directory in a manner dependent on the data key read in, and setting the parameters required for the process in accordance with the process parameter set determined. The parameter directory includes rule keys each having subkeys, which are each assigned predeterminable values from a plurality of values, and at least one subkey is assigned a wildcard, and a plurality of process parameter sets each respectively assigned at least one rule key. The step of determining a parameter set includes comparing the data key read in with the rule keys stored in the parameter directory, determining the rule key(s) whose subkeys match those of the data key read in, and outputting the process parameter set(s) assigned to the rule key(s) determined.

REFERENCES:
patent: 6240329 (2001-05-01), Sun
patent: 7181707 (2007-02-01), Kotani et al.
patent: 2004/0103083 (2004-05-01), Gaur et al.
patent: 2004/0220968 (2004-11-01), Hellig et al.
patent: 2005/0004827 (2005-01-01), Steinkirchner et al.
patent: 102 52 606 (2004-05-01), None
patent: 103 19 496 (2004-11-01), None

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