Selectively accessing test access ports in a multiple test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S729000, C714S731000

Reexamination Certificate

active

07937635

ABSTRACT:
A TAP linking module (21, 51) permits plural TAPs (TAPs1-4) to be controlled and accessed from a test bus (13) via a single TAP interface (20).

REFERENCES:
patent: 5329471 (1994-07-01), Swoboda et al.
patent: 5576980 (1996-11-01), Whetsel
patent: 5592493 (1997-01-01), Crouch et al.
patent: 5646422 (1997-07-01), Hashizume
Setty, A.A.; Martin, H.L.; , “BIST and interconnect testing with boundary scan,” Southeastcon '91., IEEE Proceedings of , vol., No., pp. 12-15 vol. 1, Apr. 7-10, 1991 doi: 10.1109/SECON.1991.147692.
Dahbura, A.T.; Uyar, M.U.; Yau, C.W.; , “An optimal test sequence for the JTAG/IEEE P1149.1 test access port controller,” Test Conference, 1989. Proceedings. Meeting the Tests of Time., International , vol., No., pp. 55-62, Aug. 29-31, 1989 doi: 10.1109/TEST.1989.82277.
Andrews, J.; , “An embedded JTAG, system test architecture,” Electro/94 International. Conference Proceedings. Combined Volumes. , vol., No., pp. 691-695, May 10-12, 1994 doi: 10.1109/ELECTR.1994.472654.
DeHon, A.; , “In-system timing extraction and control through scan-based, test-access ports,” Test Conference, 1994. Proceedings., International , vol., No., pp. 350-359, Oct. 2-6, 1994 doi: 10.1109/TEST.1994.527969.

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