Method of manufacturing photo-mask and photo-mask manufactured t

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

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430 5, 430321, 430324, 430329, 430945, 369277, 369284, 369285, 378 35, G03C 500

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active

054570069

ABSTRACT:
A photo-mask and a method of manufacturing a photo-mask, which includes the steps of applying a resist film onto a substrate of quartz, glass and the like, subjecting the resist film to light exposure and development to form a fine resist pattern, etching the mask substrate covered by the fine resist pattern, causing a non-light transmitting thin film of Cr, Ta, etc. to adhere thereon by vapor deposition, sputtering and the like, and removing the thin film on the resist pattern together with the resist film, thereby to form the photo-mask.

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patent: 4401738 (1983-08-01), Iwamatsu
patent: 4423137 (1983-12-01), Rester
patent: 4655876 (1987-04-01), Kawai et al.
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Thompson, Willson and Bowden; "Introduction to Microlithography"; pp. 216-218, ACS Symposium Series, 1983.
Suzuki and Matsui, "High Flatness Mask for Step and Repeat X-Ray Lithography", J. Vac. Sci. Technol. B4(1), Jan./Feb. 1986 pp. 221-225.
Thompson et al., "Introduction to Microlithography", Section 2.3 X-ray Lithography pp. 74-81, ACS 1983.

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