Method and apparatus for measuring the offset voltages of SRAM s

Details Method and apparatus for measuring the offset voltages of SRAM s Method and apparatus for measuring the offset voltages of SRAM s

1997-12-24

1999-04-20

Hoang, Huan

Static information storage and retrieval

Read/write circuit

Testing

365205, 365207, G11C 700

Patent

active

058963324

ABSTRACT:
Disclosed herein is a method of measuring the offset voltages of a plurality of SRAM sense amplifiers. The method comprises applying a series of stepped differential voltages to the plurality of sense amplifiers. After applying each differential voltage, an SRAM read operation is performed. The output of each sense amplifier may be interpreted with respect to the applied differential voltages. The point where a sense amplifier's output changes polarity will indicate a sense amplifier's offset voltage characteristic. Apparatus disclosed for implementing the method provides apparatus for isolating offset voltage test circuitry from other components of the SRAM while the SRAM is in a normal operating mode.

REFERENCES:
patent: 5519712 (1996-05-01), Shu et al.
patent: 5684809 (1997-11-01), Stave et al.

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