4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Jeffery C. Brauch

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Method and apparatus for measuring the offset voltages of SRAM s

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method and apparatus for measuring the offset voltages of SRAM s

Static information storage and retrieval – Read/write circuit – Testing
Patent

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On-the-fly memory testing and automatic generation of bitmaps

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1529065

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