Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1980-01-08
1981-11-24
Welsh, John D.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430313, 430325, 430435, 430436, 427431, 427273, 134 38, G03C 524
Patent
active
043025293
ABSTRACT:
A method of developing a positive electron resist for delineating a desired integrated circuit pattern upon a circuit substrate is disclosed for a positive resist consisting of a copolymer film of poly (methyl alpha-chloroacrylate-co-methacrylonitrile) utilizing a developer selected from the group consisting of benzonitrile, a mixture of benzonitrile and methyl cellosolve, and a mixture of benzonitrile and methyl ethyl ketone.
REFERENCES:
patent: 3914462 (1975-10-01), Morisnita et al.
patent: 3935332 (1976-01-01), Poliniak et al.
patent: 4011351 (1977-03-01), Gipstein et al.
patent: 4096290 (1978-06-01), Fredericks
Lai et al., Journal of the Vacuum Society Technology, 16(6), Nov./Dec. 1979.
Honeywell Inc.
Mersereau Charles G.
Welsh John D.
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