Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-07-07
1999-11-02
Nguyen, Hoa T.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
714724, G11C 3128
Patent
active
059789484
ABSTRACT:
Logic blocks are placed between a power supply terminal and a grounding terminal. Each logic block has a logic circuit in which low-threshold voltage transistors are arranged, and high-threshold voltage transistors, pHVth- and nHVth-Tr's, are placed between each terminal and the logic circuit. At the time of receiving a test signal Sdt to perform testing of wiring arranged outside the logic circuit, and HVth-Tr's, a state control unit controls each HVth-Tr to turn off and an electric current at each terminal is measured, which makes it possible to detect faulty products resulting from the malfunction of HVth-Tr's and the short-circuiting of wires. It is possible to perform failure detection with making a distinction between failure occurring in the logic circuit and failure occurring outside the logic circuit.
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Matsushita Electric - Industrial Co., Ltd.
Nguyen Hoa T.
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