Dry etching method

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

156646, 156657, 156662, 204192E, 252 791, H01L 21306

Patent

active

044067330

ABSTRACT:
In a dry etching method of etching Si, PF.sub.5 -gas is used as a source gas for plasma etching and reactive ion beam etching. The substrate can be etched at a higher rate as compared with the plasma etching in which CF.sub.4 -gas is used as the source gas.

REFERENCES:
patent: 4352724 (1982-10-01), Sugishima et al.

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