Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1998-12-23
2000-10-24
Bowers, Charles
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
H01L 218242
Patent
active
061366420
ABSTRACT:
A method of fabricating a dynamic random access memory includes forming a dummy layer over the isolation layer, in which the dummy layer has a higher etching selectivity than oxide. A dielectric layer is applied to isolate the bit lines. Then, a passivation layer is formed over the entire structure and a node contact opening is formed thereon. A liner oxide layer is then formed in the node contact opening to isolate the bit lines and the electrode of the capacitor. The node contact opening has a larger misalignment tolerance.
REFERENCES:
patent: 5600166 (1997-02-01), Clementi et al.
Lin Kun-Chi
Tan Wayne
Bowers Charles
Thompson Craig
United Microelectronics Corp.
LandOfFree
Method of making a dynamic random access memory does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making a dynamic random access memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a dynamic random access memory will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1962738