Method for testing an electronic circuit by logically combining

Details Method for testing an electronic circuit by logically combining Method for testing an electronic circuit by logically combining

1996-07-02

1998-07-14

Nguyen, Tan T.

Electronic digital logic circuitry

With test facilitating feature

326 93, 326 96, G01R 2500

Patent

active

057810257

ABSTRACT:
An electronic circuit has a plurality of nodes at which a plurality of clock signals are present in operational use. The clock signals should have a pre-determined timing relationship amongst themselves. The circuit includes logic circuitry having inputs connected to the nodes and having an output to provide a pulse train. Any discrepancy between the actual and ideal pulse trains indicates a fault.

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Ruan, "A Behavioral Model of A/D Converters Using a Mixed-Mode Simulator", IEEE Journal of Solid-State Circuits, vol. 26, No. 3, Mar. 1991, pp. 283-290.

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