Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-10-29
1999-11-09
Beausoliel, Jr., Robert W.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
365201, G01R 3128
Patent
active
059833793
ABSTRACT:
There is disclosed a test access port controller for effecting communications across a chip boundary having a test mode and a diagnostic mode of operation, wherein in the test mode of operation the test data is resultant data from a test operation having an expected and time delayed relationship, and in the diagnostic mode of operation diagnostic data is conveyed both on and off chip in the form of respective independent input and output serial bit streams simultaneously through the test access port controller.
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Standard Search Report dated Feb. 26, 1997.
IEEE Standard Test Access Port and Boundary--Scan Architecture , C.M. Maunder, IEEE Inc., May 21, 1990.
Beausoliel, Jr. Robert W.
Iqbal Nadeem
SGS-Thomson Microelectronics Limited
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