Method of fabricating stack capacitor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438398, 438255, H01L 218242

Patent

active

059813377

ABSTRACT:
A method of fabricating a stack capacitor. Using self-aligned method by the formation of spacers on the poly-silicon layer, a stack capacitor is formed by using photo-lithography and etching only once.

REFERENCES:
patent: 5399518 (1995-03-01), Sim et al.
patent: 5438013 (1995-08-01), Kim et al.
patent: 5447881 (1995-09-01), Ryou
patent: 5516719 (1996-05-01), Ryou

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating stack capacitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating stack capacitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating stack capacitor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1455081

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.