Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1996-10-23
1998-09-08
Bowers, Jr., Charles L.
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
438781, 438789, H01L 2131
Patent
active
058045082
ABSTRACT:
This invention provides a process for making a semiconductor device with reduced capacitance between adjacent conductors. This process can include applying a solution between conductors 24, and then gelling, surface modifying, and drying the solution to form an extremely porous dielectric layer 28. A non-porous dielectric layer 30 may be formed over porous layer 28, which may complete an interlayer dielectric. A novel process for creating the porous dielectric layer is disclosed, which can be completed at vacuum or ambient pressures, yet results in porosity, pore size, and shrinkage of the dielectric during drying comparable to that previously attainable only by drying gels at supercritical pressure.
REFERENCES:
patent: 4652467 (1987-03-01), Brinker et al.
patent: 4987101 (1991-01-01), Kaanta et al.
patent: 5023208 (1991-06-01), Pope et al.
patent: 5103288 (1992-04-01), Sakamoto et al.
patent: 5565142 (1996-10-01), Deshpande et al.
patent: 5641711 (1997-06-01), Cho
Cho Chih-Chen
Gnade Bruce E.
Smith Douglas M.
Bowers Jr. Charles L.
Donaldson Richard L.
Gurley Lynne A.
Harris James E.
Kesterson James C.
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