Method for preventing damage to gate oxide from well in compleme

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438666, 438675, 438189, H01L 218238

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active

06060347&

ABSTRACT:
A method for preventing damage to a gate oxide layer from a floating well in a CMOS device includes a first via plug and a second via plug formed in a dielectric layer. The first via plug is coupled to a substrate and the second via plug is coupled to the well. These two via plugs are further coupled by a conductive bridge so that both the well and the substrate have the same voltage.

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patent: 5514623 (1996-05-01), Ko et al.
patent: 5650745 (1997-07-01), Merrlii et al.
patent: 5817577 (1998-10-01), Ko

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