X-ray or gamma ray systems or devices – Specific application – Lithography
Reexamination Certificate
2009-05-05
2011-11-01
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Lithography
C359S359000, C250S492200
Reexamination Certificate
active
08050380
ABSTRACT:
A zone-optimized mirror (MZ) for reflecting extreme ultraviolet (EUV) or X-ray radiation (18) includes a reflective surface (S) having two or more substantially discrete zones (Z1, Z2, . . . Zn) that include respective coatings (C1, C2, . . . Cn). Each coating is configured to optimally reflect a select range of incident angles of the radiation incident thereon. An EUV optical system (10) and an EUV lithography system (200) that includes at least one zone-optimized mirror are also disclosed.
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Zocchi et al, “Design and optimization of collectors for extreme ultra-violet lithography,” Proc. SPIE vol. 6151 (2006).
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Kools Jacques
Zocchi Fabio
Artman Thomas R
Kiknadze Irakli
Media Lario, S.r.L.
Opticus IP Law PLLC
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