Zone-optimized mirrors and optical systems using same

X-ray or gamma ray systems or devices – Specific application – Lithography

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C359S359000, C250S492200

Reexamination Certificate

active

08050380

ABSTRACT:
A zone-optimized mirror (MZ) for reflecting extreme ultraviolet (EUV) or X-ray radiation (18) includes a reflective surface (S) having two or more substantially discrete zones (Z1, Z2, . . . Zn) that include respective coatings (C1, C2, . . . Cn). Each coating is configured to optimally reflect a select range of incident angles of the radiation incident thereon. An EUV optical system (10) and an EUV lithography system (200) that includes at least one zone-optimized mirror are also disclosed.

REFERENCES:
patent: 5027377 (1991-06-01), Thoe
patent: 5283692 (1994-02-01), Herbst
patent: 5911858 (1999-06-01), Ruffner
patent: 6049588 (2000-04-01), Cash
patent: 6317483 (2001-11-01), Chen
patent: 6566668 (2003-05-01), Rauch et al.
patent: 6833223 (2004-12-01), Shiraishi
patent: 6927901 (2005-08-01), Mann et al.
patent: 7173716 (2007-02-01), Oishi et al.
patent: 7193228 (2007-03-01), Bowering et al.
patent: 7199922 (2007-04-01), Mann et al.
patent: 7288778 (2007-10-01), Partio et al.
patent: 7403593 (2008-07-01), He et al.
patent: 7405871 (2008-07-01), Sasian
patent: 7460212 (2008-12-01), Singer et al.
patent: 7481544 (2009-01-01), McGuire, Jr.
patent: 7744215 (2010-06-01), Blum et al.
patent: 7773196 (2010-08-01), Katsuhiko et al.
patent: 2004/0108473 (2004-06-01), Melnychuk et al.
patent: 2006/0018429 (2006-01-01), Hoghoj et al.
patent: 2008/0042079 (2008-02-01), Singer et al.
patent: 2008/0266650 (2008-10-01), Sasian
patent: 2010/0151278 (2010-06-01), Zhang et al.
patent: 2010/0245758 (2010-09-01), Lytle
patent: 1 901 126 (2008-03-01), None
patent: WO2008/012111 (2008-01-01), None
patent: WO 2008/012111 (2008-01-01), None
Zocchi et al, “Design and optimization of collectors for extreme ultra-violet lithography,” Proc. SPIE vol. 6151 (2006).
Windt et al, “Multilayer facilities required for extreme-ultraviolet lithography,” J.Vac. Soc. Technol. B 12(6) Nov./Dec. 1994 pp. 3826-3832.
Feigl et al, “Multilayer collector optics for high-power LPP sources,” Poster paper, 8th Intl. Conf. on Physics of X-ray multilayer structures, Mar. 13, 2006.
Feigl et al, “Enhanced reflectivity and stability of high-temperature LPP collector mirrors,” Presentation at SPIE Advanced Lithography meeting, San Jose, CA Feb. 27, 2008.
Zocchi et al, “High-efficiency collector design for extreme-ultraviolet and X-ray applications,” Appl. Opt. vol. 45, No. 35, Dec. 10, 2006 8882-88 (OSA).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Zone-optimized mirrors and optical systems using same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Zone-optimized mirrors and optical systems using same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Zone-optimized mirrors and optical systems using same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4258773

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.