X-ray or gamma ray systems or devices – Specific application – Lithography
Patent
1982-05-24
1984-06-05
Willis, Davis L.
X-ray or gamma ray systems or devices
Specific application
Lithography
430967, B05D 306
Patent
active
044532628
ABSTRACT:
In order to obtain shorter exposure time and to obtain a longer life in x-ray lithography apparatus, an x-ray target made of tungsten is utilized and the apparatus operated to generate the tungsten M-line, this line being at a wavelength which will be absorbed by the resist normally used in lithography. To develop the resist, which was initially designed for use in an electron beam lithography, a developing method is used in which an initial short development with a high concentration is first carried out followed by a longer, full development with a concentration which is approximately the lowest at which complete development will take place.
REFERENCES:
patent: 4342917 (1982-08-01), Buckley
Giarratana S. A.
Grigsby T. N.
Grimes E. T.
Murphy T. P.
The Perkin-Elmer Corporation
LandOfFree
X-Ray lithography apparatus and method of use does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-Ray lithography apparatus and method of use, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-Ray lithography apparatus and method of use will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1501906