Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2008-12-29
2010-12-14
Nguyen, Tuan T (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S189160, C365S230060, C365S156000
Reexamination Certificate
active
07852661
ABSTRACT:
An integrated circuit structure includes a word-line; a column select line; and a latch. The latch includes a first storage node and a second storage node complementary to each other; and an operation voltage node. A control circuit is coupled between the operation voltage node and the latch. The control circuit includes a first input coupled to the word-line; and a second input coupled to the column selection line. The control circuit is configured to interconnect the operation voltage node and the latch when both the word-line and the column select line are selected, and disconnect the operation voltage node and the latch when at least one of the word-line and the column select line is not selected.
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Ramadurai, V., et al., “A Disturb Decoupled Column Select 8T SRAM Cell,” IEEE 2007 Custom Integrated Circuits Conference (CICC), 2007, pp. 25-28.
Le Toan
Nguyen Tuan T
Slater & Matsil L.L.P.
Taiwan Semiconductor Manufacturing Company , Ltd.
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