Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-10-09
2007-10-09
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10974104
ABSTRACT:
Wide geometry can be accurately extracted from the physical layout of an integrated circuit through the use of detection circles having diameters equal to a threshold width. Projection regions in the layout are selected, and for each projection region, a detection circle of a threshold width (diameter) is defined. A trim region within each projection region is defined using the associated detection circle, such that a portion of the trim region boundary exhibits tangency to the detection circle. The trim regions, which represent non-wide portions of the layout, are then removed to generate a wide element layout. Because the detection circle is a rotation-independent geometry, the over-extraction and under-extraction problems associated with conventional wide element extraction methods can be eliminated.
REFERENCES:
patent: 5701403 (1997-12-01), Watanabe et al.
patent: 6247853 (2001-06-01), Papadopoulou et al.
patent: 2002/0032552 (2002-03-01), Nishiyama et al.
patent: 2003/0126582 (2003-07-01), Kobayashi et al.
patent: 2005/0172247 (2005-08-01), Papadopoulou et al.
McFalls, Jr. Charles Samuel
Wang Yulan
Zhu Jun
Bever Hoffman & Harms LLP
Do Thuan
Harms Jeanette S.
Levin Naum
Synopsys Inc.
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