Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
Reexamination Certificate
2009-05-07
2011-11-01
Tran, Michael (Department: 2827)
Electrical computers and digital processing systems: memory
Storage accessing and control
Specific memory composition
C365S185030
Reexamination Certificate
active
08051241
ABSTRACT:
A method for managing wear levels in a storage device having a plurality of data blocks, the method comprising moving data to data blocks having higher erasure counts based on a constraint on static wear levelness that tightens over at least a portion of the lives of the plurality of data blocks.
REFERENCES:
patent: 6850443 (2005-02-01), Lofgren
patent: 7649794 (2010-01-01), Yeh
patent: 2006/0149896 (2006-07-01), Chang et al.
patent: 2006/0155917 (2006-07-01), Di Sena et al.
patent: 2006/0161728 (2006-07-01), Bennett et al.
patent: 2008/0235432 (2008-09-01), Chen et al.
patent: 2008/0276035 (2008-11-01), Hobson
patent: 2008/0276038 (2008-11-01), Tanaka et al.
patent: 2008/0282024 (2008-11-01), Biswas et al.
patent: 2008/0282025 (2008-11-01), Biswas et al.
patent: 2008/0313505 (2008-12-01), Lee et al.
patent: 2008/0320209 (2008-12-01), Lee et al.
patent: 2008/0320214 (2008-12-01), Ma et al.
patent: 2009/0013233 (2009-01-01), Radke
patent: 2009/0031076 (2009-01-01), In et al.
Frequently Asked Questions, Corsair, USB Flash Wear-Leveling and Life Span, Jun. 2007, pp. 1-2.
White Paper, Sandisk Flash Memory Cards, Wear Leveling, Oct. 2003, pp. 1-6.
Feldman Timothy R.
Haines Jonathan W.
Morrison Brian R.
Seagate Technology LLC
Tran Michael
Westman Champlin & Kelly P.A.
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