Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-05-16
2006-05-16
Dildine, R. Stephen (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C323S318000, C700S298000, C713S310000
Reexamination Certificate
active
07047471
ABSTRACT:
A voltage margin testing blade is adapted for use in a bladed server having at least one internal adjustable power supply. The testing blade is further adapted to provide a control signal to the power supply indicative of any desire to modify the output voltage of the power supply. The testing blade senses the output voltage of the power supply and compares it to a desired power supply voltage. The control signal is generated in response to this comparison in order to control the actual power supply voltage at or about the desired power supply voltage.
REFERENCES:
patent: 4418403 (1983-11-01), O'Toole et al.
patent: 6049500 (2000-04-01), Kajigaya et al.
patent: 6833721 (2004-12-01), Park et al.
patent: 3146383 (1983-05-01), None
patent: 4119233 (1992-12-01), None
patent: 54045769 (1979-04-01), None
Tsukude, M. et al.; Highly reliable testing of ULSI memories with on-chip voltage-down converters; Design & Test of Computers, IEEE vol.: 10 , Issue: 2 pp.: 6-12; Jun. 1993; ISSN: 0740-7475.
Hewlett-Packard Company, HP Manageability Solution Brief: HP Blade Server Environment, Apr. 2002.
Hewlett-Packard Company, HP Blade Server Data Sheet, Dec. 2001.
Dallas Semiconductor, “Dual Digital Potentiometer with EEPROM”, pp. 1-14.
Cavanna Michelle
Mastoris Steve
Monfared Akbar
LandOfFree
Voltage margin testing of bladed servers does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Voltage margin testing of bladed servers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Voltage margin testing of bladed servers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3544479