Voltage margin testing of bladed servers

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C323S318000, C700S298000, C713S310000

Reexamination Certificate

active

07047471

ABSTRACT:
A voltage margin testing blade is adapted for use in a bladed server having at least one internal adjustable power supply. The testing blade is further adapted to provide a control signal to the power supply indicative of any desire to modify the output voltage of the power supply. The testing blade senses the output voltage of the power supply and compares it to a desired power supply voltage. The control signal is generated in response to this comparison in order to control the actual power supply voltage at or about the desired power supply voltage.

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patent: 6833721 (2004-12-01), Park et al.
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patent: 54045769 (1979-04-01), None
Tsukude, M. et al.; Highly reliable testing of ULSI memories with on-chip voltage-down converters; Design & Test of Computers, IEEE vol.: 10 , Issue: 2 pp.: 6-12; Jun. 1993; ISSN: 0740-7475.
Hewlett-Packard Company, HP Manageability Solution Brief: HP Blade Server Environment, Apr. 2002.
Hewlett-Packard Company, HP Blade Server Data Sheet, Dec. 2001.
Dallas Semiconductor, “Dual Digital Potentiometer with EEPROM”, pp. 1-14.

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