Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1980-03-19
1982-01-05
Punter, William H.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
350239, 356243, 434367, G09B 2500, G02B 2700
Patent
active
043091113
ABSTRACT:
An apparatus to facilitate the grading of coins which takes the form of a thin planar housing which has an elongated rectangularly shaped recess within its upper planar surface. Adjacent the elongated recess is located a plurality of standard graded master coin replicas, made in accordance with certain accepted standards, which are sequentially arranged from the greatest wear condition to the least wear condition, such as "very good", "fine", "very fine", and "extra fine". A block is located within the recess and is movable longitudinally along the entire length of the recess. Upon the block is to be located the coin which is to be graded. This coin is capable of being positioned directly adjacent each specimen. The observer can then accurately determine the precise wear level of this coin. The block is maintained in continuous contact with the recess through the use of a ridge and groove assembly.
REFERENCES:
patent: 2121246 (1938-06-01), Gordon
patent: 2425197 (1947-08-01), Montague
patent: 2533628 (1950-12-01), Rosenberg
patent: 3200517 (1965-08-01), D'Agostino
patent: 3609045 (1971-09-01), Stein
patent: 4191472 (1980-03-01), Mason
Munro Jack C.
Punter William H.
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