Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2009-11-03
2011-11-22
Nguyen, Dao (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S156000, C257S206000, C257S207000, C257S328000, C257S329000, C257S331000, C257S332000, C257SE21252, C257SE21652, C257SE21657, C438S268000, C438S270000, C438S275000, C438S277000, C438S278000
Reexamination Certificate
active
08063441
ABSTRACT:
A vertical pillar semiconductor device may include a substrate, a group of channel patterns, a gate insulation layer pattern and a gate electrode. The substrate may be divided into an active region and an isolation layer. A first impurity region may be formed in the substrate corresponding to the active region. The group of channel patterns may protrude from a surface of the active region and may be arranged parallel to each other. A second impurity region may be formed on an upper portion of the group of channel patterns. The gate insulation layer pattern may be formed on the substrate and a sidewall of the group of channel patterns. The gate insulation layer pattern may be spaced apart from an upper face of the group of channel patterns. The gate electrode may contact the gate insulation layer and may enclose a sidewall of the group of channel patterns.
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patent: 6239022 (2001-05-01), Seo et al.
patent: 6337497 (2002-01-01), Hanafi et al.
patent: 7767525 (2010-08-01), Manning et al.
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patent: 10-2001-0061118 (2001-07-01), None
patent: 10-2003-0031600 (2003-04-01), None
Kang Jong-Hyuk
Lee Jong-Wook
Son Yong-Hoon
Harness & Dickey & Pierce P.L.C.
Nguyen Dao
Samsung Electronics Co,. Ltd.
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