Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-04-29
2010-06-22
Rodriguez, Paul L (Department: 2123)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S015000
Reexamination Certificate
active
07743350
ABSTRACT:
In one embodiment, a method for satisfiability (SAT)-based bounded model checking (BMC) includes isolating information learned from a first iteration of an SAT-based BMC process and applying the isolated information from the first iteration of the SAT-based BMC process to a second iteration of the SAT-based BMC process subsequent to the first iteration.
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Baker & Botts L.L.P.
Fujitsu Limited
Ochoa Juan C
Rodriguez Paul L
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