Cleaning and liquid contact with solids – Processes – For metallic – siliceous – or calcareous basework – including...
Patent
1998-07-30
2000-02-15
Gulakowski, Randy
Cleaning and liquid contact with solids
Processes
For metallic, siliceous, or calcareous basework, including...
134 13, 134 18, 134 29, 134 32, 134 34, 134902, 134 12, B08B 600, B08B 704, B08B 300, B08B 102
Patent
active
060248025
ABSTRACT:
A vapor processing method for reducing oxide material depletion includes an early step of placing a polymer-coated substrate inside a vapor process chamber (VPC), a pre-processing step of passing an inert gas into the VPC for a definite period followed by an idling period, a clearing step of passing a reactive gas carried by an inert carrier into the VPC for clearing away previously deposited polymer on the substrate, and a post-processing step of passing an inert gas into the VPC to purge any unreacted reactive gases. Thereafter, the substrate is transferred to a dry task chamber (DTC) for cleaning, wherein the cleaning includes removing any residual gases on the wafer surface. Time required for cleaning the wafer in the DTC is smaller than the total time required for pre-processing, polymer clearing and post-processing.
REFERENCES:
patent: 5693148 (1997-12-01), Simmons et al.
Sung Mei-Hui
Tai Shih-Kuan
Gulakowski Randy
Wilkins Yolanda E.
Winbond Electronics Corp.
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