Static information storage and retrieval – Read/write circuit – Including signal clamping
Reexamination Certificate
2005-08-16
2005-08-16
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Including signal clamping
C365S189090, C365S226000
Reexamination Certificate
active
06930930
ABSTRACT:
Leakage in semiconductors, such as dynamic random access memory (DRAM) devices, caused by word line/bit line shorts can be avoided by locating transistors (e.g., isolator, current limiter, equalize) inside isolated p-wells.
REFERENCES:
patent: 5499211 (1996-03-01), Kirihata et al.
patent: 5519243 (1996-05-01), Kikuda et al.
patent: 5650975 (1997-07-01), Hamade et al.
patent: 5905679 (1999-05-01), Tsukikawa
patent: 6002162 (1999-12-01), Takahashi et al.
patent: 6046948 (2000-04-01), Zheng et al.
patent: 6141259 (2000-10-01), Scott et al.
patent: 6144599 (2000-11-01), Akita et al.
patent: 6228704 (2001-05-01), Uchida
patent: 6252806 (2001-06-01), Ellis et al.
patent: 4300826 (1994-01-01), None
patent: 2269049 (1994-01-01), None
Shochi: “Semiconductor Storage Device and its Manufacture”, Patent Abstracts of Japan, Oct. 15, 1999, No. 11284146 (1 page).
Shigenobu: “Semiconductor Memory”, Patent Abstracts of Japan, Jan. 22, 1999, No. 11017134 (1 page).
Yamagata, T., et al., “Low Voltage Circuit Design Techniques for Battery-Operated and/or Giga-Scale Dram's,” IEEE Journal of Solid-State Circuits, vol. 30, No. 11, Nov. 1995, pp. 1183-1188, New York, US.
Menke Manfred
Terletzki Hartmud
Infineon - Technologies AG
Luu Pho M.
Nguyen Van Thu
Slater & Matsil L.L.P.
LandOfFree
Using isolated p-well transistor arrangements to avoid... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Using isolated p-well transistor arrangements to avoid..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Using isolated p-well transistor arrangements to avoid... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3477888