4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Jorge Luque

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Method and system for centering wafer on chuck

Data processing: measuring – calibrating – or testing – Calibration or correction system – For mechanical system
Reexamination Certificate

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Process controls for improved wafer uniformity using...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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User interface for quantifying wafer non-uniformities and...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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User interface for wafer data analysis and visualization

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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User interface for wafer data analysis and visualization

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2272238

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