Use of a plasma source to form a layer during the formation...

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

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C438S720000, C438S780000

Reexamination Certificate

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09471460

ABSTRACT:
A method used to form a semiconductor device having a capacitor comprises placing a semiconductor wafer assembly into a chamber of a plasma source, the wafer assembly comprising a layer of insulation having at least one contact therein and a surface, and further comprising a conductive layer over the surface and in the contact. Next, in the chamber, a layer of etch resistant material is formed within the contact over the conductive layer, the etch resistant material not forming over the surface.

REFERENCES:
patent: 3755720 (1973-08-01), Kern
patent: 4082604 (1978-04-01), Yanez
patent: 4256534 (1981-03-01), Levinstein et al.
patent: 4267013 (1981-05-01), Iida et al.
patent: 4371407 (1983-02-01), Kurosawa
patent: 4412885 (1983-11-01), Wang et al.
patent: 4417914 (1983-11-01), Lehrer
patent: 4599135 (1986-07-01), Tsunekawa et al.
patent: 4624864 (1986-11-01), Hartmann
patent: 4759958 (1988-07-01), Numata et al.
patent: 4784719 (1988-11-01), Schutz
patent: 4797373 (1989-01-01), Malhi et al.
patent: 4830691 (1989-05-01), Kida et al.
patent: 4838992 (1989-06-01), Abraham
patent: 4872947 (1989-10-01), Wang et al.
patent: 4918033 (1990-04-01), Bartha et al.
patent: 4919748 (1990-04-01), Bredbenner et al.
patent: 4962063 (1990-10-01), Maydan et al.
patent: 5048413 (1991-09-01), Deiters
patent: 5066607 (1991-11-01), Banerjee
patent: 5079178 (1992-01-01), Chouan et al.
patent: 5084413 (1992-01-01), Fujita et al.
patent: 5093279 (1992-03-01), Andreshak et al.
patent: 5096849 (1992-03-01), Beilstein, Jr. et al.
patent: 5110712 (1992-05-01), Kessler et al.
patent: 5150276 (1992-09-01), Gonzalez et al.
patent: 5162248 (1992-11-01), Dennison et al.
patent: 5164332 (1992-11-01), Kumar
patent: 5182230 (1993-01-01), Donelon et al.
patent: 5185282 (1993-02-01), Lee et al.
patent: 5204288 (1993-04-01), Marks et al.
patent: 5232509 (1993-08-01), Min et al.
patent: 5252988 (1993-10-01), Katayama et al.
patent: 5284787 (1994-02-01), Ahn
patent: 5286675 (1994-02-01), Chen et al.
patent: 5292677 (1994-03-01), Dennison
patent: 5312773 (1994-05-01), Nagashima
patent: 5316616 (1994-05-01), Nakamura et al.
patent: 5326431 (1994-07-01), Kadomura
patent: 5354715 (1994-10-01), Wang et al.
patent: 5364809 (1994-11-01), Kwon et al.
patent: 5364817 (1994-11-01), Lur et al.
patent: 5382316 (1995-01-01), Hills et al.
patent: 5419822 (1995-05-01), Dakesian et al.
patent: 5422294 (1995-06-01), Noble, Jr.
patent: 5422310 (1995-06-01), Ito
patent: 5441594 (1995-08-01), Zenke
patent: 5443941 (1995-08-01), Bariya et al.
patent: 5472564 (1995-12-01), Nakamura et al.
patent: 5472904 (1995-12-01), Figura et al.
patent: 5476817 (1995-12-01), Numata
patent: 5486493 (1996-01-01), Jeng
patent: 5496773 (1996-03-01), Rhodes et al.
patent: 5562801 (1996-10-01), Nulty
patent: 5565384 (1996-10-01), Havemann
patent: 5783101 (1998-07-01), Ma et al.
patent: 5788870 (1998-08-01), Nguyen et al.
patent: 5804259 (1998-09-01), Robles
patent: 5821621 (1998-10-01), Jeng
patent: 5837596 (1998-11-01), Figura et al.
patent: 5904799 (1999-05-01), Donohoe
patent: 5950092 (1999-09-01), Figura et al.
patent: 6089183 (2000-07-01), Imai et al.
patent: 6117764 (2000-09-01), Figura et al.
patent: 6278174 (2001-08-01), Havemann et al.
patent: 721205 (1996-07-01), None
patent: 59-103338 (1984-06-01), None
patent: 62-030330 (1987-02-01), None
patent: 62-032618 (1987-02-01), None
patent: 01-149418 (1989-06-01), None
patent: 06-275568 (1994-09-01), None
Ephrath, L. M., “Teflon Polymer Mask for RIE of Contact Roles”, IBM Technical Disclosure Bulletin, vol. 25, No. 9, pp. 4587-4588.
Tetsuo Ono, Ryoji Hamasaki and Tatsumi Mizutani, “Mechanism for CF Polymer Film Deposition through Deep SiO2Holes in Electron Cyclotron Resonance Plasma,” Jpn. J. Appl. Phys. vol. 35, pp. 2468-2471, Part 1, No. 4B, Apr. 1996.
Ephrath, L. M., “Teflon Polymer Mask for RIE of Contact Roles,” IBM Technical Disclosure Bulletin, vol. 25, No. 9, pp. 4587-4588, Feb. 1983.
U.S. Appl. Ser. No. 09/470,650, entitled Use of a Plasma Source to Form a Layer During the Formation of a Semiconductor Device, filed Dec. 22, 1999; Thomas A. Figura, Kevin Donohoe, and Thomas Dunbar, inventors; Preliminary Amendment filed Dec. 22, 1999; Response to the Office Action dated May 3, 2001, filed May 21, 2001.
U.S. Appl. Ser. No. 09/470,651, entitled Use of a Plasma Source to a Form a Layer During the Formation of a Semiconductor Device, filed Dec. 22, 1999; Thomas A. Figura, Kevin Donohoe, and Thomas Dunbar, inventors; Preliminary Amendment filed Dec. 22, 1999; Amendment After the Continued Prosecution Application and Response to the Office Action dated Apr. 13, 2000 filed Jul. 13, 2000; Response to the Office Action dated Sep. 26, 2000 filed Oct. 5, 2000; Amendment and Response to the Office Action dated Nov. 21, 2000, filed May 21, 2001.

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