Ultrathin chemically grown oxide film as a dopant diffusion...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S643000, C438S652000, C438S654000, C438S508000

Reexamination Certificate

active

11215951

ABSTRACT:
The invention is a chemically grown oxide layer which prevents dopant diffusion between semiconductor layers. The chemically grown oxide layer may be so thin that it does not form a barrier to electrical conduction, and thus may be formed within active devices such as diodes or bipolar transistors. Such a chemically grown oxide film is advantageously used to prevent dopant diffusion in a vertically oriented polysilicon diode formed in a monolithic three dimensional memory array.

REFERENCES:
patent: 5792569 (1998-08-01), Sun et al.
Asuha, T. , et al., “Ultrathin silicon dioxide layers with a low leakage current density formed by chemical oxidation of Si”,Applied Physics Letters, vol. 81, No. 18, (Oct. 28, 2002), 3410-3412.
Ellis, K A., et al., “Phosphorus Diffusion in Silicon Oxide and Oxynitride Gate Dielectrics”,Electrochem. Sol. St. Lett. 2, (1999), 516-518.
Hamada, T., et al., “Thin Inter-Polyoxide Films for Flash Memories Grown at Low Temperature (400° ) by Oxygen Radicals”,IEEE Elect. Dev. Lett. vol. 22, No. 9, (Sep. 2001), 423-425.
Malhotra, Vinod et al., “An Electrothermal Model of Memory Switching in Vertical Polycrystalline Silicon Structures”,IEEE Transactions on Electron Devices, vol. 35, 9, (Sep. 1988), 1514-1523.
Nutzel, J F., et al., “Comparison of P and Sb as n-dopants for Si molecular beam epitaxy”,J. Appl. Phys. 78 (2), (Jul. 15, 1995), 937-940.
Park, B., et al., “Study of contact resistance in in-situ phosphorus layer doped Si deposition process”,Electrochemical Society Proceedings 99-31(1999), 34-45.
Raider, S I., et al., “Abstract: Stoichiometry of SiO2/Si interfacial regions: I. Ultrathin oxide films”,J. Vac. Sci. Tech. vol. 13, No. 1, (Jan./Feb. 1976), 58.
Singh, D V., et al., “Abrupt phosphorus profiles in Si: Effects of temperature and substitutional carbon on phosphorus autodoping”,Journal of the Electrochemical Society, 150, (2003), G553-G556.

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