Tripod for polishing a sample and for viewing the sample under a

Details Tripod for polishing a sample and for viewing the sample under a Tripod for polishing a sample and for viewing the sample under a

1996-05-03

1998-03-10

Anderson, Bruce

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

250306, H01J 3720

Patent

active

057264546

ABSTRACT:
A sample holder tripod for grinding a square edge on a sample and for observing the sample with a microscope is provided. The sample tripod comprises: a tripod base, a support, two adjustable micrometer leg assemblies, a sample stage and a grinding bubble indicator. The micrometer leg assembles are mounted to the tripod through a micrometer mounting holes. The stage has a means to mount a sample. The sample holder tripod can be positioned to view the sample in a top down view and cross-sectional view without having to re-focus the microscope.

REFERENCES:
patent: 4785177 (1988-11-01), Besocke
patent: 4788797 (1988-12-01), Kane et al.
patent: 4894537 (1990-01-01), Blackford et al.
patent: 4895033 (1990-01-01), Voss et al.
patent: 5033834 (1991-07-01), Corder et al.
patent: 5041783 (1991-08-01), Ohta et al.
patent: 5256876 (1993-10-01), Hazaki et al.
patent: 5416414 (1995-05-01), Mansfield et al.
patent: 5479013 (1995-12-01), Forster et al.
patent: 5508517 (1996-04-01), Onuki et al.

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