Transmission electron microscope

Details Transmission electron microscope Transmission electron microscope

2008-01-15

2008-01-15

Berman, Jack I. (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

Reexamination Certificate

active

11356169

ABSTRACT:
A transmission electron microscope has a means for inputting a spatial size or distance d desired to be observed by the operator, calculates high contrast of an image based on this value and an observing condition which can reduce the influence of a false image superimposed, and desirably modulates an accelerating voltage of the electron microscope based thereon.

REFERENCES:
patent: 05-217536 (1992-02-01), None
patent: 2003-229085 (2002-01-01), None
Scherzer, O., “The Theoretical Resolution Limit of the Electron Microscope”, Journal of Applied Physics, vol. 20, (Jan. 1949), pp. 20-29.

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