Transistors having implanted channel layers and methods of...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S332000, C428S172000

Reexamination Certificate

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08049272

ABSTRACT:
A MESFET includes a silicon carbide layer, spaced apart source and drain regions in the silicon carbide layer, a channel region positioned within the silicon carbide layer between the source and drain regions and doped with implanted dopants, and a gate contact on the silicon carbide layer. Methods of forming a MESFET include providing a layer of silicon carbide, forming spaced apart source and drain regions in the silicon carbide layer, implanting impurity atoms to form a channel region between the source and drain regions, annealing the implanted impurity atoms, and forming a gate contact on the silicon carbide layer.

REFERENCES:
patent: 4757028 (1988-07-01), Kondoh
patent: 4762806 (1988-08-01), Suzuki
patent: 5270554 (1993-12-01), Palmour
patent: 5925895 (1999-07-01), Sriram
patent: 6218680 (2001-04-01), Carter, Jr.
patent: 6310385 (2001-10-01), Ajit
patent: 6902964 (2005-06-01), Sriram
patent: 6906350 (2005-06-01), Sriram
patent: 6982204 (2006-01-01), Saxler et al.
patent: 7238560 (2007-07-01), Sheppard et al.
Yokogawa et al. “Electronic Properties of Nitrogen Delta-Doped Silicon Carbide Layer”, Mat. Res. Soc. Symp. Proc. vol. 640. Fall Symposium, 2000.
Konstantinov et al. “Investigation of Lo-Hi-Lo and Delta Doped Silicon Carbide Structure” Mat. Res. Soc. Symp. Proc. vol. 640. Fall Symposium, 2000.
Tucker et al. “Fully Ion Implanted MESFETs in Bulk Semi-Insulating 4H-SiC.” Diamond and Related Materials 11, pp. 1344-1348, 2002.
Ogata et al. “RF Characteristics of a Fully Ion-Implanted MESFET on a Bulk Semi-Insulating 4H-SiC Substrate” Mat. Sci. Forum vols. 527-529, pp. 1235-1238, 2006.

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