Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-12-01
2010-06-08
Lebentritt, Michael S (Department: 2829)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S286000, C438S305000, C438S586000, C438S595000, C257SE21417, C257SE21435, C257SE27132, C257SE27133, C257SE29151, C257SE29152, C257SE29255, C257SE29256, C257SE29257
Reexamination Certificate
active
07732282
ABSTRACT:
The transistor comprises a source and a drain separated by a lightly doped intermediate zone. The intermediate zone forms first and second junctions respectively with the source and with the drain. The transistor comprises a first gate to generate an electric field in the intermediate zone, on the same side as the first junction, and a second gate to generate an electric field in the intermediate zone, on the same side as the second junction.
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Gopalakrishnan et al., “Impact Ionization MOS (I-MOS)—Part II: Experimental Results,”IEEE Transactions on Electron Devices, vol. 52, No. 1, Jan. 2005, pp. 77-84.
Choi et al., “80nm Self-Aligned Complementary I-MOS Using Double Sidewall Spacer and Elevated Drain Structure and Its Applicability to Amplifiers with High Linearity,”International Electron Devices Meeting, Dec. 13-15, 2004, pp. 203-206.
Clavelier Laurent
Faynot Olivier
Le Royer Cyrille
Commissariat a l''Energie Atomique
Lebentritt Michael S
Oliff & Berridg,e PLC
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