Transistor of the I-MOS type comprising two independent...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S286000, C438S305000, C438S586000, C438S595000, C257SE21417, C257SE21435, C257SE27132, C257SE27133, C257SE29151, C257SE29152, C257SE29255, C257SE29256, C257SE29257

Reexamination Certificate

active

07732282

ABSTRACT:
The transistor comprises a source and a drain separated by a lightly doped intermediate zone. The intermediate zone forms first and second junctions respectively with the source and with the drain. The transistor comprises a first gate to generate an electric field in the intermediate zone, on the same side as the first junction, and a second gate to generate an electric field in the intermediate zone, on the same side as the second junction.

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Gopalakrishnan et al., “Impact Ionization MOS (I-MOS)—Part II: Experimental Results,”IEEE Transactions on Electron Devices, vol. 52, No. 1, Jan. 2005, pp. 77-84.
Choi et al., “80nm Self-Aligned Complementary I-MOS Using Double Sidewall Spacer and Elevated Drain Structure and Its Applicability to Amplifiers with High Linearity,”International Electron Devices Meeting, Dec. 13-15, 2004, pp. 203-206.

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