Transistor and method of fabricating the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S284000, C438S300000, C257S287000, C257S344000

Reexamination Certificate

active

08048745

ABSTRACT:
Disclosed are a semiconductor device and a method of fabricating the same. The semiconductor device can include a transistor structure including a gate electrode and a first channel region and source/drain regions on a substrate, and a second channel region and source/drain regions provided on the transistor structure. Accordingly, transistor operations can utilize the current path above and below the gate electrode.

REFERENCES:
patent: 5578513 (1996-11-01), Maegawa
patent: 5965919 (1999-10-01), Yoo
patent: 7354831 (2008-04-01), Orlowski
patent: 10-0321757 (2002-01-01), None
patent: 10-2006-0069561 (2006-06-01), None
English Machine translation of Korean Patent KR-10-0321757 assigned to KIm dated :Jan. 10, 2002 ( 10 pages ).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Transistor and method of fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Transistor and method of fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Transistor and method of fabricating the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4305764

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.